基于故障對(duì)布爾表的模擬電路測(cè)試性分析方法
發(fā)布時(shí)間：2018-09-16 21:42
【摘要】：為充分利用測(cè)試性驗(yàn)證試驗(yàn)的故障響應(yīng)特征信息,提高測(cè)試性分析結(jié)果的準(zhǔn)確性,基于故障物理注入技術(shù),提出采用整數(shù)對(duì)布爾表對(duì)模擬電路進(jìn)行測(cè)試性分析的方法。首先分析現(xiàn)有測(cè)試性分析方法存在的不足之處;然后根據(jù)實(shí)測(cè)數(shù)據(jù)構(gòu)建故障對(duì)布爾表,并以此為基礎(chǔ)提出預(yù)計(jì)故障檢測(cè)率、故障隔離率和故障虛警率等指標(biāo)的計(jì)算公式以及測(cè)試性分析步驟;最后結(jié)合串聯(lián)穩(wěn)壓電路實(shí)例對(duì)文章所提方法進(jìn)行驗(yàn)證。實(shí)驗(yàn)結(jié)果表明:與D矩陣模型方法和整數(shù)編碼字典方法相比,該法都具有更高的故障分辨能力,能夠?yàn)槟M電路的測(cè)試性分析提供更準(zhǔn)確的評(píng)價(jià)指標(biāo)。
[Abstract]:In order to make full use of the fault response characteristic information of testability verification test and improve the accuracy of testability analysis results, a testability analysis method based on integer Boolean table for analog circuits is proposed based on fault physical injection technique. Firstly, the shortcomings of the existing testability analysis methods are analyzed, and then the fault pair Boolean table is constructed according to the measured data, and based on this, the estimated fault detection rate is proposed. The calculation formula of fault isolation rate and fault false alarm rate and the steps of testability analysis are given. Finally, the method proposed in this paper is verified by an example of series voltage stabilizing circuit. The experimental results show that compared with the D matrix model method and the integer coding dictionary method, this method has higher fault resolution ability and can provide more accurate evaluation indexes for the testability analysis of analog circuits.
【作者單位】： 海軍航空工程學(xué)院研究生管理大隊(duì);海軍航空工程學(xué)院科研部;92514部隊(duì);
【基金】：國(guó)家自然科學(xué)基金項(xiàng)目(61473306)
【分類號(hào)】：TN710
[Abstract]:In order to make full use of the fault response characteristic information of testability verification test and improve the accuracy of testability analysis results, a testability analysis method based on integer Boolean table for analog circuits is proposed based on fault physical injection technique. Firstly, the shortcomings of the existing testability analysis methods are analyzed, and then the fault pair Boolean table is constructed according to the measured data, and based on this, the estimated fault detection rate is proposed. The calculation formula of fault isolation rate and fault false alarm rate and the steps of testability analysis are given. Finally, the method proposed in this paper is verified by an example of series voltage stabilizing circuit. The experimental results show that compared with the D matrix model method and the integer coding dictionary method, this method has higher fault resolution ability and can provide more accurate evaluation indexes for the testability analysis of analog circuits.
【作者單位】： 海軍航空工程學(xué)院研究生管理大隊(duì);海軍航空工程學(xué)院科研部;92514部隊(duì);
【基金】：國(guó)家自然科學(xué)基金項(xiàng)目(61473306)
【分類號(hào)】：TN710
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