模擬測試交換格式的研究與實現(xiàn)
發(fā)布時間：2018-12-18 07:00
【摘要】：隨著電子技術(shù)的飛速發(fā)展,電子產(chǎn)品領(lǐng)域的不斷擴(kuò)大,電子技術(shù)已經(jīng)深入到航空、醫(yī)療、教育等各個方面,但是由于電路系統(tǒng)的不斷更新,其結(jié)構(gòu)也越來越復(fù)雜,這給電路測試、維護(hù)帶來了更大的困難。僅僅依靠人為修復(fù)故障設(shè)備已經(jīng)無法滿足社會需求,尤其是軍工、航空等領(lǐng)域,設(shè)備出現(xiàn)故障時需要迅速的定位與修復(fù)。 目前電路故障診斷系統(tǒng)主要分為電路仿真和后處理兩大部分,電路仿真部分主要完成電路仿真、數(shù)據(jù)結(jié)果采集、知識處理等,后處理部分主要完成智能診斷和TPS測試執(zhí)行,仿真和后處理之間的信息交互就顯得十分重要。目前數(shù)字電路發(fā)展較快,其仿真系統(tǒng)和測試格式已經(jīng)相當(dāng)成熟,然而模擬電路由于其自身輸入信號的連續(xù)性、不可窮舉性,故障模型復(fù)雜等特點,致使故障診斷相對發(fā)展較慢,模擬測試交換格式(ATIF)至今沒有一個標(biāo)準(zhǔn)。 為了提高自動測試系統(tǒng)對模擬電路故障診斷的效率和水平,本課題研究定義一種模擬測試的交換機(jī)制,為基于仿真測試程序集的開發(fā)和數(shù)據(jù)傳遞提供信息和數(shù)據(jù)格式。本文針對目前科研項目,對模擬故障電路診斷系統(tǒng)進(jìn)行接口設(shè)計,研究電路仿真和后處理部分與AT工F數(shù)據(jù)之間的通信關(guān)系,制定AT工F文件的存儲內(nèi)容以及文件之間的相互關(guān)系,實現(xiàn)了交互數(shù)據(jù)的統(tǒng)一管理與調(diào)度。由于模擬電路故障復(fù)雜多變,為了保證ATIF數(shù)據(jù)的全面與測試的有效性,本文通過SPICE仿真引擎采用多激勵注入對電路進(jìn)行蒙特卡洛仿真分析,將仿真數(shù)據(jù)進(jìn)行小波分析提取特征,并采用人工智能診斷算法BPN.SVM.AIS進(jìn)行知識生成與評價。最終根據(jù)自定義的ATIF交換格式實現(xiàn)ATIF文件自動生成,最后用ATIF數(shù)據(jù)對一個模擬電路實例進(jìn)行故障診斷,實驗結(jié)果證明了模擬測試交換格的有效性。
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【學(xué)位授予單位】：北方工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN710
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【學(xué)位授予單位】：北方工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN710
【參考文獻(xiàn)】
相關(guān)期刊論文 前10條
1 彭良玉;禹旺兵;;基于小波分析和克隆選擇算法的模擬電路故障診斷[J];電工技術(shù)學(xué)報;2007年06期
2 吳洪興;彭宇;彭喜元;;基于支持向量機(jī)多分類方法的模擬電路故障診斷研究[J];電子測量與儀器學(xué)報;2007年04期
3 宋國明;王厚軍;劉紅;姜書艷;;基于提升小波變換和SVM的模擬電路故障診斷[J];電子測量與儀器學(xué)報;2010年01期
4 陳東陽;高蒙;郝絨華;劉寧寧;;小波分析應(yīng)用于負(fù)載類型及用電大小的識別[J];工業(yè)計量;2006年05期
5 胡梅;胡列峰;明德祥;;模擬電路統(tǒng)一軟故障診斷的研究[J];電子測量與儀器學(xué)報;2013年11期
6 孫小進(jìn);郭恩全;;基于IEEE1232的故障診斷系統(tǒng)的軟件架構(gòu)設(shè)計[J];電子測量與儀器學(xué)報;2014年01期
7 袁慧梅,李錦萍;模擬電路故障診斷新方法[J];航空精密制造技術(shù);2002年02期
8 成偉蘭 ,劉堅強(qiáng) ,賀U，
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