發(fā)布時間：2018-09-18 11:49

【摘要】：隨著現(xiàn)代微波電子系統(tǒng)的快速發(fā)展,對能夠工作在W波段的高性能微波材料的研制和測試技術(shù)提出了迫切的要求,其中,W波段低損耗微波介質(zhì)材料的研制和測試是整個W波段微波技術(shù)發(fā)展的基礎(chǔ)。對W波段低損耗微波介質(zhì)材料而言,如何精確測量其相對介電常數(shù)和損耗角正切非常重要,在諸多W波段低損耗微波介質(zhì)材料測試方法中,W波段準(zhǔn)光腔測試法具有測量精度高、雜模抑制能力強(qiáng)、操作方便等優(yōu)點(diǎn),非常適合在毫米波波段對低損耗微波介質(zhì)材料的相對介電常數(shù)和損耗角正切進(jìn)行測量。為減少甚至消除高次模的影響,提高測量精度,本文從以下幾個方面對W波段準(zhǔn)光腔法復(fù)介電常數(shù)測試系統(tǒng)進(jìn)行了研究:1、選擇更容易獲得較高精度的固定腔長法,通過對比平凹腔和雙凹腔的優(yōu)劣,選擇了裝載樣品更方便、結(jié)構(gòu)更簡單的平凹腔結(jié)構(gòu)。2、根據(jù)束波理論對準(zhǔn)光腔內(nèi)部場結(jié)構(gòu)進(jìn)行分析,利用MATLAB數(shù)值計(jì)算,得到腔體內(nèi)基模和高階模高斯波束的電場和磁場分布,給出準(zhǔn)光腔的基本參量和耦合系數(shù)?的推導(dǎo)過程,并研究它們對腔體性能的影響。3、根據(jù)準(zhǔn)光腔的基本參量和耦合系數(shù)?要求,采用窮舉法計(jì)算出合適的腔長D;利用HFSS電磁仿真軟件進(jìn)行建模和仿真,對比分析通過式和反射式準(zhǔn)光腔的性能,選用單端口反射式準(zhǔn)光腔方式;將仿真得到的主模與高次模的諧振頻率與理論計(jì)算結(jié)果相對比,得到基模頻率偏差小于1MHz,符合測試要求。4、利用Solidworks三維機(jī)械結(jié)構(gòu)設(shè)計(jì)軟件,對全系統(tǒng)的結(jié)構(gòu)進(jìn)行設(shè)計(jì)、制圖及加工,特別對關(guān)鍵尺寸的公差及模型的形位公差進(jìn)行了詳細(xì)的設(shè)計(jì),最終設(shè)計(jì)并加工出滿足要求的球面鏡、平面鏡、轉(zhuǎn)接板、鏡面定位裝置及等高柱等全系統(tǒng)的結(jié)構(gòu)件。5、搭建了兩套不同腔長D的W波段準(zhǔn)光腔復(fù)介電常數(shù)測試系統(tǒng),將工作頻率設(shè)置在86GHz到102GHz之間,對同一待測石英玻璃基片樣品的復(fù)介電常數(shù)進(jìn)行測試,并將測試結(jié)果與理論計(jì)算結(jié)果對比分析。
[Abstract]:With the rapid development of modern microwave electronic system, the development and testing technology of high performance microwave materials which can work in W band are urgently required. The development and test of W band low loss microwave dielectric material is the basis of the development of W band microwave technology. For W-band low-loss microwave dielectric materials, it is very important to accurately measure their relative dielectric constant and loss angle tangent. Due to the advantages of strong heterodyne suppression and convenient operation, it is very suitable to measure the relative dielectric constant and loss angle tangent of low loss microwave dielectric material in millimeter wave band. In order to reduce or even eliminate the influence of high order mode and improve the measurement accuracy, this paper studies the complex dielectric constant measurement system of the W-band quasi-optical cavity method from the following aspects, and selects the fixed cavity length method with higher accuracy. By comparing the advantages and disadvantages of flat cavity and double concave cavity, the structure of flat concave cavity with easier loading sample and simpler structure is selected. According to the beam wave theory, the internal field structure of optical cavity is analyzed, and the numerical calculation is made by MATLAB. The electric field and magnetic field distribution of the fundamental mode and the higher-order mode Gao Si beam in the cavity are obtained, and the basic parameters and coupling coefficient of the quasi-optical cavity are given. Based on the basic parameters and coupling coefficient of the quasi-optical cavity? According to the requirement, the appropriate cavity length D is calculated by exhaustive method, the modeling and simulation are carried out by using HFSS electromagnetic simulation software, the performance of passing and reflecting quasi-optical resonators is compared and analyzed, and the single-port reflection quasi-optical cavity is chosen. By comparing the resonant frequency of the main mode and the high order mode obtained by simulation with the theoretical calculation results, it is found that the fundamental mode frequency deviation is less than 1 MHz, which meets the test requirements. The structure of the whole system is designed by using Solidworks 3D mechanical structure design software. Drawing and machining, especially the tolerance of key dimensions and the tolerance of shape and position of the model are designed in detail. Finally, the spherical mirror, plane mirror and connecting plate that meet the requirements are designed and processed. Two W-Band quasi-optical cavity complex dielectric constant measurement systems with different cavity length D are set up. The working frequency is set between 86GHz and 102GHz. The complex permittivity of the same quartz glass substrate was measured, and the results were compared with the theoretical results.
【學(xué)位授予單位】：電子科技大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2017
【分類號】：TN015

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